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We report a giant enhancement of the mid-infrared (MIR) magneto-opticalcomplex Kerr angle (polarization change of reflected light) in a variety ofmaterials grown on SiC. In epitaxially-grown multilayer graphene, the Kerrangle is enhanced by a factor of 68, which is in good agreement with Kerrsignal modeling. Strong Kerr enhancement is also observed in Fe films grown onSiC and Al-doped bulk SiC. Our experiments and modelling indicate that theenhancement occurs at the high-energy edge of the SiC reststrahlen band wherethe real component of the complex refractive index n passes through unity.Furthermore, since the signal is greatly enhanced when n=1, the enhancement ispredicted to exist over the entire visible/infrared (IR) spectrum for afree-standing film. We also predict similar giant enhancement in both Faraday(transmission) and Kerr rotation for thin films on a metamaterial substratewith refractive index n=-1. This work demonstrates that the substrate used inMOKE measurements must be carefully chosen when investigating magneto-opticalmaterials with weak MOKE signals or when designing MOKE-based optoelectronicdevices.

Giant magneto-optical Kerr enhancement from films on SiC due to the optical properties of the substrate