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The magnetic properties of rare earth compounds are usually well captured byassuming a fully localized f shell and only considering the Hund's rule groundstate multiplet split by a crystal electrical field (CEF). Currently, thestandard technique for probing CEF excitations in lanthanides is inelasticneutron scattering. Here we show that with the recent leap in energyresolution, resonant inelastic soft X-ray scattering has become a seriousalternative for looking at CEF excitations with some distinct advantagescompared to INS. As an example we study the CEF scheme in CeRh2Si2, a systemthat has been intensely studied for more than two decades now but for which noconsensus has been reached yet as to its CEF scheme. We used two new featuresthat have only become available very recently in RIXS, high energy resolutionof about 30 meV as well as polarization analysis in the scattered beam, to finda unique CEF description for CeRh2Si2. The result agrees well with previous INSand magnetic susceptibility measurements. Due to its strong resonant character,RIXS is applicable to very small samples, presents very high cross sections forall lanthanides, and further benefits from the very weak coupling to phononexcitation. The rapid progress in energy resolution of RIXS spectrometers ismaking this technique increasingly attractive for the investigation of the CEFscheme in lanthanides.

physical review. b./physical review. b

High-resolution resonant inelastic soft X-ray scattering as a probe of  the crystal electrical field in lanthanides demonstrated for the case of  CeRh2Si2