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We have carried out bulk-sensitive hard x-ray photoelectron spectroscopy(HAXPES) measurements on in-situ cleaved and ex-situ polished SmB6 singlecrystals. Using the multiplet-structure in the Sm 3d core level spectra, wedetermined reliably that the valence of Sm in bulk SmB6 is close to 2.55 at ~5K. Temperature dependent measurements revealed that the Sm valence graduallyincreases to 2.64 at 300 K. From a detailed line shape analysis we can clearlyobserve that not only the J=0 but also the J=1 state of the Sm 4f 6configuration becomes occupied at elevated temperatures. Making use of thepolarization dependence, we were able to identify and extract the Sm 4fspectral weight of the bulk material. Finally, we revealed that the oxidized orchemically damaged surface region of the ex-situ polished SmB6 single crystalis surprisingly thin, about 1 nm only.

Bulk and surface electronic properties of SmB6: a hard x-ray photoelectron spectroscopy study