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Electron energy loss spectra have been measured on hexagonal boron nitridesingle crystals employing a novel electron energy loss spectroscopic set-upcomposed by an electron microscope equipped with a monochromator and anin-column filter. This set-up provides high-quality energy-loss spectra andallows also for the imaging of energy-filtered diffraction patterns. These twoacquisition modes provide complementary pieces of information, offering aglobal view of excitations in reciprocal space. As an example of thecapabilities of the method we show how easily the core loss spectra at the $K$edges of boron and nitrogen can be measured and imaged. Low losses associatedto interband and/or plasmon excitations are also measured. This energy rangeallows us to illustrate that our method provides results of quality comparableto those obtained from non resonant X-ray inelastic scattering, but withadvantageous specificities such as an enhanced sensitivity at low q and a muchhigher simplicity and versatility that makes it well adapted to the study oftwo-dimensional materials and related heterostructures. Finally, by comparingtheoretical calculations against our measures, we are able to relate the rangeof applicability of ab initio calculations to the anisotropy of the sample andassess the level of approximation required for a proper simulation of ouracquisition method.

Angular resolved electron energy loss spectroscopy in hexagonal boron nitride