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Scanning tunneling microscopy (STM) reveals unusual sharp features inotherwise defect free bismuth nanolines self-assembled on Si(001). They appearas subatomic thin lines perpendicular to the bismuth nanoline at positivebiases and as atomic size beads at negative biases. Density functional theory(DFT) simulations show that these features can be attributed to buckled Sidimers substituting for Bi dimers in the nanoline, where the sharp feature isthe counterintuitive signature of these dimers flipping during scanning. Theperfect correspondence between the STM data and the DFT simulation demonstratedin this study highlights the detailed understanding we have of the complexBi-Si(001) Haiku system.

Sub-atomic electronic feature from dynamic motion of Si dimer defects in bismuth nanolines on Si(001)