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Ferroelectric relaxors are complex materials with distinct properties. Theunderstanding of their dielectric susceptibility, which strongly depends onboth temperature and probing frequency, have interested researchers for manyyears. Here we report a macroscopic and phenomenological approach based onstatistical modeling to investigate and better understand how the dielectricresponse of a relaxor depends on temperature. Employing the Maxwell-Boltzmanndistribution and considering temperature dependent dipolar orientationalpolarizability, we propose a minimum statistical model and specific equationsto understand and fit numerical and experimental dielectric responses versustemperature. We show that the proposed formula can successfully fit thedielectric response of typical relaxors, including Ba(Zr,Ti)O$_{3}$,Pb(Zn$_{1/3}$Nb$_{2/3}$)$_{0.87}$Ti$_{0.13}$O$_{3}$, andPb(Mg$_{1/3}$Nb$_{2/3}$)O$_{3}$-0.05Pb(Zr$_{0.53}$Ti$_{0.47}$)O$_{3}$, whichdemonstrates the general applicability of this approach.

Insight into dielectric response of ferroelectric relaxors by statistical modeling