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We report on dynamic effects associated with thermally-annealing amorphousindium-oxide films. In this process the resistance of a given sample maydecrease by several orders of magnitude at room-temperatures, while itsamorphous structure is preserved. The main effect of the process isdensification - increased system density. The study includes the evolution ofthe system resistivity during and after the thermal-treatment, the changes inthe conductance-noise, and accompanying changes in the optical properties. Thesample resistance is used to monitor the system dynamics during the annealingperiod as well as the relaxation that ensues after its termination. Thesereveal slow processes that fit well a stretched-exponential law, a behaviorthat is commonly observed in structural glasses. There is an intriguingsimilarity between these effects and those obtained in high-pressuredensification experiments. Both protocols exhibit the "slow spring-back"effect, a familiar response of memory-foams. A heuristic picture based on amodified Lennard-Jones potential for the effective interparticle interaction isargued to qualitatively account for these densification-rarefaction phenomenain amorphous materials whether affected by thermal-treatment or by applicationof high-pressure.

Memory vs. irreversibility in thermal densification of amorphous glasses