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Organic semiconductors tend to self-assemble into highly ordered and orientedmorphologies with anisotropic optical properties. Studying these opticalanisotropies provides insight into processing-dependent structural propertiesand informs the photonic design of organic photovoltaic and light-emittingdevices. Here, we measure the anisotropic optical properties of spin-cast filmsof the n-type polymer P(NDI2OD-T2) using momentum-resolved absorption andemission spectroscopies. We quantify differences in the optical anisotropies offilms deposited with distinct face-on and edge-on morphologies. In particular,we infer a substantially larger out-of-plane tilt angle of the opticaltransition dipole moment in high temperature annealed, edge-on films.Measurements of spectral differences between in-plane and out-of-plane dipoles,further indicate regions of disordered polymers in low temperature annealedface-on films that are otherwise obscured in traditional X-ray and opticalcharacterization techniques. The methods and analysis developed in this workprovide a way to identify and quantify subtle optical and structuralanisotropies in organic semiconductors that are important for understanding anddesigning highly efficient thin film devices.

Morphology dependent optical anisotropies in the n-type polymer P(NDI2OD-T2)