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The Dzyaloshinskii-Moriya Interaction (DMI) has recently attractedconsiderable interest owing to its fundamental role in the stabilization ofchiral spin textures in ultrathin ferromagnets, which are interestingcandidates for future spintronic technologies. Here we employ a scanningnano-magnetometer based on a single nitrogen-vacancy (NV) defect in diamond tolocally probe the strength of the interfacial DMI in CoFeB/MgO ultrathin filmsgrown on different heavy metal underlayers X=Ta,TaN, and W. By measuring thestray field emanating from DWs in micron-long wires of such materials, weobserve deviations from the Bloch profile for TaN and W underlayers that areconsistent with a positive DMI value favoring right-handed chiral spinstructures. Moreover, our measurements suggest that the DMI constant might varylocally within a single sample, illustrating the importance of local probes forthe study of magnetic order at the nanoscale.

Direct measurement of interfacial Dzyaloshinskii-Moriya interaction in X/CoFeB/MgO heterostructures with a scanning-NV magnetometer