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We study a polarizer-analyzer mounting for the terahertz regime withperfectly conducting metallic polarizers made of a periodic subwavelengthpattern. We analytically investigate the influence on the transmission responseof the multiple reflections which occur between polarizer and analyzer with arenewed Jones formalism. We demonstrate that this interaction leads to amodified transmission response: the extended Malus' Law. In addition, we showthat the transmission response can be controlled by the distance betweenpolarizer and analyzer. For particular set-ups, the mounting exhibits extremelysensitive transmission responses. This interesting feature can be employed forhigh precision sensing and characterization applications. We specificallypropose a general design for measuring electro-optical response of materials inthe terahertz domain allowing detection of refractive index variations as smallas $10^{-5}$.

Extended Malus' Law with THz metallic metamaterials for sensitive detection with giant tunable quality factor