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The structure of a graphene monolayer on Ir(111) has been investigated {\itin situ} in the growth chamber by surface x-ray diffraction including thespecular rod, which allows disentangling the effect of the sample roughnessfrom that of the nanorippling of graphene and iridium along the moir{\'e}-likepattern between graphene and Ir(111). Accordingly we are able to provideprecise estimates of the undulation associated with this nanorippling, which issmall in this weakly interacting graphene/metal system and thus proveddifficult to assess in the past. The nanoripplings of graphene and iridium arefound in phase, i.e. the in-plane position of their height maxima coincide, butthe amplitude of the height modulation is much larger for graphene (\(0.379 \pm0.044\) \AA) than, {\it e.g.}, for the topmost Ir layer (\(0.017 \pm 0.002\)\AA). The average graphene-Ir distance is found to be \(3.38 \pm 0.04\) \AA.

Topography of the graphene/Ir(111) moir{\'e} studied by surface x-ray diffraction