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We investigate electron vortex beams elastically scattered on chiralcrystals. After deriving a general expression for the scattering amplitude of avortex electron, we study its diffraction on point scatterers arranged on ahelix. We derive a relation between the handedness of the helix and thetopological charge of the electron vortex on one hand, and the symmetry of theHigher Order Laue Zones in the diffraction pattern on the other forkinematically and dynamically scattered electrons. We then extend this to atomsarranged on a helix as found in crystals which belong to chiral space groupsand propose a new method to determine the handedness of such crystals bylooking at the symmetry of the diffraction pattern. Contrary to alternativemethods, our technique does not require multiple scattering which makes itpossible to also investigate extremely thin samples in which multiplescattering is suppressed. In order to verify the model, elastic scatteringsimulations are performed and an experimental demonstration onMn$_2$Sb$_2$O$_7$ is given where we find the sample to belong to the righthanded variant of its enantiomorphic pair. This demonstrates the usefulness ofelectron vortex beams to reveal the chirality of crystals in a transmissionelectron microscope and provides the required theoretical basis for furtherdevelopments in this field.

Using electron vortex beams to determine chirality of crystals in transmission electron microscopy