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Understanding the growth of organic semi-conducting molecules with shapeanisotropy is of high relevance to the processing of optoelectronic devices.This work provides insight into the growth of thin films of the prototypicalrodlike organic semiconductor diindenoperylene on a microscopic level, byanalyzing in detail the film morphology. We model our data, which were obtainedby high-resolution grazing incidence small angle x-ray scattering (GISAXS),using a theoretical description from small angle scattering theory derived forsimple liquids. Based on form factor calculations for different object types wedetermine how the island shapes change in the respective layers. Atomic forcemicroscopy measurements approve our findings.

On the analysis of island shape evolution from diffuse x-ray scattering of organic thin films and the implications for growth