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Depth-sensitive magnetic, structural and chemical characterization isimportant in the understanding and optimization of novel physical phenomenaemerging at interfaces of transition metal oxide heterostructures. In asimultaneous approach we have used polarized neutron and resonant X-rayreflectometry to determine the magnetic profile across atomically sharpinterfaces of ferromagnetic La0.67Sr0.33MnO3 / multiferroic BiFeO3 bi-layerswith sub-nanometer resolution. In particular, the X-ray resonant magneticreflectivity measurements at the Fe and Mn resonance edges allowed us todetermine the element specific depth profile of the ferromagnetic moments inboth the La0.67Sr0.33MnO3 and BiFeO3 layers. Our measurements indicate amagnetically diluted interface layer within the La0.67Sr0.33MnO3 layer, incontrast to previous observations on inversely deposited layers. Additionalresonant X-ray reflection measurements indicate a region of an altered Mn- andO-content at the interface, with a thickness matching that of the magneticdiluted layer, as origin of the reduction of the magnetic moment.

Element-Specific Depth Profile of Magnetism and Stoichiometry at the La0.67Sr0.33MnO3/BiFeO3 Interface