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We present an experimental procedure for obtaining the conduction channels oflow-dimensional conductors based on shot noise measurements. The transmissioncoefficient for each channel is determined numerically from the measuredconductance and Fano factor. The channel analysis is demonstrated for atomiccontacts of Ag, Au, Al and Pt, showing their channel evolution as a function ofconductance and mechanical elongation. This approach can be readily applied tomap the conduction channels in a wide range of nanoscale conductors underdifferent conditions.

Experimental determination of conduction channels in atomic scale conductors based on shot noise measurements