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Spin-polarized electrical transport is investigated in $Al_{2}O_{3}/Ni_{80}Fe_{20}/Al_{2}O_{3}$ thin films for permalloy thicknessbetween 6 and 20nm. The degree of spin-polarization of the current flowing inthe plane of the film is measured through the current induced spin wave Dopplershift. We find that it decreases as the film thickness decreases, from 0.72 at20nm to 0.46 at 6nm. This decrease is attributed to a spin depolarizationinduced by the film surfaces. A model is proposed which takes into account thecontributions of the different sources of electron scattering (alloy disorder,phonons, thermal magnons, grain boundaries, film surfaces) to the measuredspin-dependent resistivities.

Thickness dependence of the degree of spin polarization of the electrical current in permalloy thin films