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Crystal and domain structures of tensile-strained BiFeO3 films grown onorthorhombic (110)o PrScO3 substrates were investigated. All films possess aMB-type monoclinic structure with 109o stripe domains oriented along the[\=i10]o direction. For films thicknesses less than ~40 nm, presence ofwell-ordered domains is proved by the detection of satellite peaks insynchrotron x-ray diffraction studies. For thicker films, For thicker films,only the Bragg reflections from tilted domains were detected. This isattributed to the broader domain size distribution in thicker films.Usingplanar electrodes,the in-plane polarization of the MB phase is determined to be85 uC/cm2, which is much larger than that of compressive strained BiFeO3 films.Our results further reveal that the substrate monoclinic distortion plays amajor role in determining the stripe domain formation of the rhombohedralferroic epitaxial thin films, which sheds light to the understanding of elasticdomain structure evolution in many other functional oxide thin films as well.

Large tensile strain induced monoclinic MB phase in BiFeO3 epitaxial thin films on PrScO3 substrate