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Using a combination of resonant soft x-ray scattering, magnetometry, x-rayreflectivity and microscopy techniques we have investigated the magneticproperties and microstructure of a series of perpendicular anisotropy Co/Ptmultilayer films with respect to structural disorder tuned by varying thesputtering deposition pressure. The observed magnetic changes in domain size,shape and correlation length originate from structural and chemical variationsin the samples, such as chemical segregation and grain formation as well asroughness at the surface and interfaces, which are all impacted by thedeposition pressure. For low pressure samples we find evidence of a random"gas-like" distribution of magnetic domains, while in the higher pressuresamples the domain structure exhibits only short range "liquid-like" positionalordering. The structural and chemical disorder induced by the higher depositionpressure first leads to an increase in the number of magnetic point defectsthat limit free domain wall propagation. Then, as the sputtering pressure isfurther increased, the domain wall energy density is lowered due to theformation of local regions with reduced magnetic moment, and finallymagnetically void regions appear that confine the magnetic domains andclusters, similar to segregated granular magnetic recording media.

The influence of structural disorder on magnetic domain formation in perpendicular anisotropy thin films