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We study the critical current I_c dependence on applied magnetic field H formultifacet YBa_2Cu_3O_{7-\delta}-Au-Nb ramp-type zigzag Josephson junctions.For many experiments one would like to apply a homogeneous field in thejunction plane. However, even tiny misalignments can cause drastic deviationsfrom homogeneity. We show this explicitly by measuring and analyzing I_c vs. Hfor an 8 facet junction, forming an array of 4\times(0-\pi)-segments. The rampangle is \theta_r=8^\circ. The facet width is 10\,\mum. H is applied underdifferent angles \theta relative to the substrate plane and different angles\phi relative to the in-plane orientation of the zigzags. We find that ahomogeneous flux distribution is only achieved for an angle \theta_h\approx1^\circ - 2^\circ and that even a small misalignment \sim 0.1^\circ relative to\theta_h can cause a substantial inhomogeneity of the flux density inside thejunction, drastically altering its I_c vs. H interference pattern. We alsoshow, that there is a dead angle \theta^*_d relative to \theta_h of similarmagnitude, where the average flux density completely vanishes.

Magnetic field dependence of the critical current in YBa_2Cu_3O_{7-\delta}/Au/Nb ramp-zigzag Josephson junctions