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Kramers-Kronig Constrained Modeling of Soft X-ray Reflectivity Spectra - Obtaining Depth Resolution of Electronic and Chemical Structure Kevin H. Stone ∗ and Jerey B. Kortright † Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA 94720 S. Manuel Valvidares ALBA Synchrotron Light Source, 082980 Cerdonyola del Vall`es, Barcelona, Spain (Dated: April 27, 2012) Abstract Resonant x-ray scattering is a powerful technique for the determination of electronic structure at the nanoscale. In common practice, the optical properties of the constituent components of a material must be known prior to modeling of the scattered intensity. We present a means of rening electronic structure, in the form of optical properties, simultaneous to physical structure, in a Kramers-Kronig consistent manner. This approach constitutes a sensitive and powerful extension of resonant x-ray scattering to materials where the optical properties are not suciently well known. The application of this approach to specular reectivity from a single crystal of SrTiO 3 is presented as an example case, wherein we nd evidence for both a non-resonant surface contaminant layer and a modied SrTiO 3 surface region. Extrapolating from this study we comment on the potential utility of this approach to resonant scattering studies in general.

Kramers-Kronig constrained modeling of soft x-ray reflectivity spectra: Obtaining depth resolution of electronic and chemical structure