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It is widely believed that carrier-density inhomogeneities ("electron-holepuddles") in single-layer graphene on a substrate like quartz are due tocharged impurities located close to the graphene sheet. Here we demonstrate byusing a Kohn-Sham-Dirac density-functional scheme that corrugations in a realsample are sufficient to determine electron-hole puddles on length scales thatare larger than the spatial resolution of state-of-the-art scanning tunnelingmicroscopy.

Electron-hole puddles in the absence of charged impurities