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We have developed a model for experiments in which the bias current appliedto a Josephson junction is slowly increased from zero until the junctionswitches from its superconducting zero-voltage state, and the bias value atwhich this occurs is recorded. Repetition of such measurements yieldsexperimentally determined probability distributions for the bias current at themoment of escape. Our model provides an explanation for available data on thetemperature dependence of these escape peaks. When applied microwaves areincluded we observe an additional peak in the escape distributions anddemonstrate that this peak matches experimental observations. The resultssuggest that experimentally observed switching distributions, with and withoutapplied microwaves, can be understood within classical mechanics and may notexhibit phenomena that demand an exclusively quantum mechanical interpretation.

A classical statistical model for distributions of escape events in swept-bias Josephson junctions