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We report a systematic study of the magnetic field sensitivity of a magneticsensor based on a single Nitrogen-Vacancy (NV) defect in diamond, by usingcontinuous optically detected electron spin resonance (ESR) spectroscopy. Wefirst investigate the behavior of the ESR contrast and linewidth as a functionof the microwave and optical pumping power. The experimental results are ingood agreement with a simplified model of the NV defect spin dynamics, yieldingto an optimized sensitivity around 2 \mu T/\sqrt{\rm Hz}. We then demonstratean enhancement of the magnetic sensitivity by one order of magnitude by using asimple pulsed-ESR scheme. This technique is based on repetitive excitation ofthe NV defect with a resonant microwave \pi-pulse followed by an optimizedread-out laser pulse, allowing to fully eliminate power broadening of the ESRlinewidth. The achieved sensitivity is similar to the one obtained by usingRamsey-type sequences, which is the optimal magnetic field sensitivity for thedetection of DC magnetic fields.

Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced DC-magnetic field sensitivity