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Nanoscale enables a broad range of electromechanical coupling mechanisms thatare forbidden or negligible in the materials. We conduct a theoretical study ofthe electromechanical response of thin paraelectric films with mobile vacancies(or ions) paradigmatic for capacitor-type measurements in X-ray scattering,piezoresponse force microscopy (PFM), and electrochemical strain microscopy(ESM). Using quantum paraelectric SrTiO3 film as a model material with wellknown electromechanical, electronic and electrochemical properties, we evaluatethe contributions of electrostriction, Maxwell stress, flexoelectric effect,deformation potential and compositional Vegard strains caused by mobilevacancies (or ions) and electrons to the electromechanical response. The localelectromechanical response manifests strong size effects, the scale of which isdetermined by the ratio of the SrTiO3 film thickness and PFM/ESM tip size tothe carriers screening radius. Due to the strong dielectric nonlinearity effectinherent in quantum paraelectrics, the dependence of the SrTiO3 filmelectromechanical response on applied voltage demonstrates a pronouncedcrossover from the linear to the quadratic law and then to the sub-linear lawwith a factor of 2/3 under the voltage increase. The temperature dependence ofthe electromechanical response as determined by the interplay between thedielectric susceptibility and the screening radius is non-monotonic and has apronounced maxima, the position and width of which can be tuned by filmthickness. This study provides a comparative framework for analysis ofelectromechanical coupling in the non-piezoelectric nanosystems.

physical review. b, condensed matter and materials physics

Nanoscale Electromechanics of Paraelectric Materials with Mobile  Charges: Size effects and Nonlinearity of Electromechanical Response of  SrTiO3 Films