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A correlation between flux-pinning characteristics and stacking faults (SFs) formed by Sm substitution on Y and Ba sites was found in Sm-doped YBa2Cu3O7- (YBCO) films. It was confirmed that 223 type SFs, Y2Ba2Cu3Ox, composed of extra Y and O planes aligned parallel to the ab-planes formed via Sm substitution on the Y site and increased in number with increasing Sm doping on the Ba site. The number density of 223 SFs is correlated strongly with the enhancement in ab-plane correlated flux-pinning, resulting in a sharpening of the H ab peak in the plot of critical current density versus magnetic field orientation.

Formation of stacking faults and their correlation with flux pinning and critical current density in Sm-doped YBa2Cu3O7−δfilms