English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Strong coupling among external voltage, electrochemical potentials,concentrations of electronic and ionic species, and strains is a ubiquitousfeature of solid state mixed ionic-electronic conductors (MIECs), the materialsof choice in devices ranging from electroresistive and memristive elements toion batteries and fuel cells. Here, we analyze in detail the electromechanicalcoupling mechanisms and derive generalized bias-concentration-strain equationsfor MIECs including effects of concentration-driven chemical expansion,deformation potential, and flexoelectric effect contributions. This analysis isextended towards the bias-induced strains in the uniform and scanning probemicroscopy-like geometries. Notably, the contribution of the electron-phononand flexoelectric coupling to the local surface displacement of the mixedionic-electronic conductor caused by the electric field scanning probemicroscope tip has not been considered previously. The developed thermodynamicapproach allows evolving theoretical description of mechanical phenomenainduced by the electric fields (electro-mechanical response) in solid stateionics towards analytical theory and phase-field modeling of the MIECs indifferent geometries and under varying electrical, chemical, and mechanicalboundary conditions.

Thermodynamics of Electromechanically-Coupled Mixed Ionic-Electronic Conductors: Deformation potential, Vegard strains and Flexoelectric effect