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Cross-sectional scanning tunnelling microscopy and spectroscopy (XSTM/S) wereused to map out the band alignment across the complex oxide interface ofLa$_{2/3}$Ca$_{1/3}$MnO$_{3}$/Nb-doped SrTiO$_{3}$. By a controlledcross-sectional fracturing procedure, unit-cell high steps persist near theinterface between the thin film and the substrate in the non-cleavableperovskite materials. The abrupt changes of the mechanical and electronicproperties were visualized directly by XSTM/S. Using changes in the DOS asprobe by STM, the electronic band alignment across the heterointerface wasmapped out providing a new approach to directly measure the electronicproperties at complex oxide interfaces.

Visualizing nanoscale electronic band alignment at the La$_{2/3}$Ca$_{1/3}$MnO$_{3}$/Nb:SrTiO$_{3}$ interface