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Received 22 April 2010; published 14 May 2010High-purity, type IIa diamond is investigated by noncontact atomic force microscopy NC-AFM .Wepresent atomic-resolution images of both the electrically conducting hydrogen-terminated C 100 - 2 1 :Hsurface and the insulating C 100 - 2 1 surface. For the hydrogen-terminated surface, a nearly square unitcell is imaged. In contrast to previous scanning tunneling microscopy experiments, NC-AFM imaging allowsboth hydrogen atoms within the unit cell to be resolved individually, indicating a symmetric dimer alignment.Upon removing the surface hydrogen, the diamond sample becomes insulating. We present atomic-resolutionimages, revealing individual C-C dimers. Our results provide real-space experimental evidence for a 2 1dimer reconstruction of the truly insulating C 100 surface.DOI: 10.1103/PhysRevB.81.201403 PACS number s : 68.37.Ps, 61.66.Bi

physical review b

Atomic-resolution imaging of clean and hydrogen-terminated C(100)-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mrow><mml:mo>(</mml:mo><mml:mrow><mml:mn>2</mml:mn><mml:mo>×</mml:mo><mml:mn>1</mml:mn></mml:mrow><mml:mo>)</mml:mo></mml:mrow></mml:mrow></mml:math>diamond surfaces using noncontact AFM

Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2×1)diamond surfaces using noncontact AFM