English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Open

Presents the pdf analysis as premium feature

PDF Analysis

Insights

Presents the summarisation as premium feature

Summarisation

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

International audienceThe thickness dependency of the Curie temperature in stress-free Pb Zr0.5Ti0.5 O3 ultrathin films under open-circuit conditions is revealed from the computation of some nontrivial statistical quantities such as fourth-order cumulants , via a first-principles-based technique. For thicknesses above 16 Å, this dependency follows the usual finite-size scaling law with a critical exponent that is consistent with the one associated with the three-dimensional-random-Ising universality class. On the other hand, the Curie temperature-versus-film's thickness curve deviates from this scaling law below 12 Å while being rather well described by an empirical equation down to 8 Å

Dependence of Curie temperature on the thickness of an ultrathin ferroelectric film