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We report on optical reflection measurements of thin Au films at and aroundthe percolation threshold (film thickness 3 to 10 nm) in an extremely broadspectral range from 500 to 35000 cm-1 (0.3 - 20 *10-6 m). Combiningspectroscopic ellipsometry and Fourier-transform infrared spectroscopy, thedielectric properties of the films can be described over the whole frequencyrange by Kramers-Kronig consistent effective dielectric functions. The opticalconductivity of the films is dominated by two contributions: by aDrude-component starting at the percolation threshold in the low frequencyrange and a plasmon in the near-infrared region, which shifts down in frequencywith increasing film thickness. The interplay of both components leads to adielectric anomaly in the infrared region with a maximum of the dielectricconstant at the insulator-to-metal transition.

Dielectric properties of ultrathin metal films around the percolation threshold