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We demonstrate that the magnetic field dependence of the conductivitymeasured at the transition temperature allows the dynamical critical exponent,the thickness of thin superconducting films and interfaces, and the limitinglateral length to be determined. The resulting tool is applied to theconductivity data of an amorphous Nb0.15 Si0.85 film and a LaAlO3/SrTiO3interface.

A tool to estimate the critical dynamics and thickness of superconducting films and interfaces