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We investigate the electronic structure of high-quality single-crystalLaNiO$_3$ (LNO) thin films using in situ photoemission spectroscopy (PES). Thein situ high-resolution soft x-ray PES measurements on epitaxial thin filmsreveal the intrinsic electronic structure of LNO. We find a new sharp featurein the PES spectra crossing the Fermi level, which is derived from thecorrelated Ni 3$d$ $e_g$ electrons. This feature shows significant enhancementof spectral weight with decreasing temperature. From a detailed analysis ofresistivity data, the enhancement of spectral weight is attributed toincreasing electron correlations due to antiferromagnetic fluctuations.Comment: 4 pages, 4 figures. submitted to Phys. Rev.

physical review. b, condensed matter and materials physics

Electronic structure of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">La</mml:mi><mml:mi mathvariant="normal">Ni</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mrow><mml:mn>3</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>: An<i>in situ</i>soft x-ray photoemission and absorption study

Electronic structure ofLaNiO3−x: Anin situsoft x-ray photoemission and absorption study