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We exploit millimeter wave technology to measure the reflection andtransmission response of random dielectric media. Our samples are easilyconstructed from random stacks of identical, sub-wavelength quartz and Teflonwafers. The measurement allows us to observe the characteristic transmissionresonances associated with localization. We show that these resonances giverise to enhanced attenuation even though the attenuation of homogeneous quartzand Teflon is quite low. We provide experimental evidence of disorder-inducedslow light and superluminal group velocities, which, in contrast to photoniccrystals, are not associated with any periodicity in the system. Furthermore,we observe localization even though the sample is only about four times thelocalization length, interpreting our data in terms of an effective cavitymodel. An algorithm for the retrieval of the internal parameters of randomsamples (localization length and average absorption rate) from the externalmeasurements of the reflection and transmission coefficients is presented andapplied to a particular random sample. The retrieved value of the absorption isin agreement with the directly measured value within the accuracy of theexperiment.Comment: revised and expande

Millimeter wave localization: Slow light and enhanced absorption in random dielectric media