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We address Fano-like interference effects in scanning tunneling microscopy(STM) measurements of nanoscale systems, e.g. two-level systems. Common forthese systems is that second order tunneling contributions give rise tointerference effects that cause suppressed transmission through the system forcertain energies. The suppressed transmission is measurable either in thedifferential conductance or in the bias voltage derivative thereof.

Detection of exchange interaction in STM measurements through Fanolike interference effects