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We present a structural analysis of the multi-layer graphene-4HSiC(000-1})system using Surface X-Ray Reflectivity. We show for the first time thatgraphene films grown on the C-terminated (000-1}) surface have agraphene-substrate bond length that is very short (0.162nm). The measureddistance rules out a weak Van der Waals interaction to the substrate andinstead indicates a strong bond between the first graphene layer and the bulkas predicted by ab-initio calculations. The measurements also indicate thatmulti-layer graphene grows in a near turbostratic mode on this surface. Thisresult may explain the lack of a broken graphene symmetry inferred fromconduction measurements on this system [C. Berger et al., Science 312, 1191(2006)].Comment: 9 pages with 6 figure

physical review. b, condensed matter and materials physics

Structural properties of the multilayer graphene/<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mn>4</mml:mn><mml:mi>H</mml:mi><mml:mtext>−</mml:mtext><mml:mi mathvariant="normal">Si</mml:mi><mml:mi mathvariant="normal">C</mml:mi><mml:mrow><mml:mo>(</mml:mo><mml:mn>000</mml:mn><mml:mover accent="true"><mml:mn>1</mml:mn><mml:mo stretchy="false">¯</mml:mo></mml:mover><mml:mo>)</mml:mo></mml:mrow></mml:mrow></mml:math>system as determined by surface x-ray …

Structural properties of the multilayer graphene/4H−SiC(0001¯)system as determined by surface x-ray …