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Using scanning tunneling spectroscopy we examined the local density of statesof thin c-axis La2-xSrxCuO4 films, over wide doping and temperature ranges. Wefound that the pseudogap exists only at doping levels lower than optimal. For x= 0.12, close to the 'anomalous' x = 1/8 doping level, a zero bias conductancepeak was the dominant spectral feature, instead of the excepted V- shaped(c-axis tunneling) gap structure. We have established that this surprisingeffect cannot be explained by tunneling into (110) facets. Possible origins forthis unique behavior are discussed.

Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films