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In a previous paper (Avotina et al.,Phys. Rev. B Vol.71, 115430 (2005)) wehave shown that in principle it is possible to image the defect positions belowa metal surface by means of a scanning tunnelling microscope. The principlerelies on the interference of electron waves scattered on the defects, whichgive rise to small but measurable conductance fluctuations. Whereas in thatwork the band structure was assumed to be free-electron like, here weinvestigate the effects of Fermi surface anisotropy. We demonstrate that theamplitude and period of the conductance oscillations are determined by thelocal geometry of the Fermi surface. The signal results from those points forwhich the electron velocity is directed along the vector connecting the pointcontact to the defect. For a general Fermi surface geometry the position of themaximum amplitude of the conductance oscillations is not found for the tipdirectly above the defect. We have determined optimal conditions fordetermination of defect positions in metals with closed and open Fermisurfaces.Comment: 23 pages, 8 figure

Signature of Fermi-surface anisotropy in point contact conductance in the presence of defects