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Spin Polarized Low Energy Electron Microscopy is used as a spin dependentspectroscopic probe to study the spin dependent specular reflection of apolarized electron beam from two different magnetic thin film systems:Fe/W(110) and Co/W(110). The reflectivity and spin-dependentexchange-scattering asymmetry are studied as a function of electron kineticenergy and film thickness, as well as the time dependence. The largest value ofthe figure of merit for spin polarimetry is observed for a 5 monolayer thickfilm of Co/W(110) at an electron kinetic energy of 2eV. This value is 2 ordersof magnitude higher than previously obtained with state of the art Mini-Mottpolarimeter. We discuss implications of our results for the development of anelectron-spin-polarimeter using the exchange-interaction at low energy.Comment: 5 pages, 4 figure

Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films