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Time dependent STM has been used to evaluate step fluctuations as a functionof temperature (300-450 K) on Ag(111) films grown on mica. The temporalcorrelation function scales as a power law in time, t^1/n with measured valuesof 1/n varying over a range of 0.19 pm 0.04 to 0.29 pm 0.04 with no dependenceon temperature. The average value of 1/n = 0.24 pm 0.01 is consistent withstep-edge diffusion limited fluctuations (n = z = 4, conserved noise). Themagnitude of the time correlation function and the width of the fluctuationsboth scale with temperature with the same apparent activation energy of Eeff =0.21 pm 0.02 eV, indicating that the correlation time is at most weaklytemperature dependent. Direct analysis of the autocorrelation function confirmsthat the correlation time is at most weakly temperature dependent, and thus theapparent correlation length is strongly temperature dependent. This behaviorcan be reproduced by assuming that the apparent correlation length is governedby the longest wavelength of step fluctuations that can be sampled in themeasurement time interval. Evaluation of the correlation time for previousmeasurements for Al/Si(111) (z =2) yields the same conclusion about measurementtime interval. In both cases the ratio of the measurement time to the effectivecorrelation time is on the order of 10

Correlation time for step structural fluctuations