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The conductivity of organic semiconductors is measured {\it in-situ} andcontinuously with a bottom contact configuration, as a function of filmthickness at various gate voltages. The depletion layer thickness can bedirectly determined as a shift of the threshold thickness at which electriccurrent began to flow. The {\it in-situ} and continuous measurement can alsodetermine qualitatively the accumulation layer thickness together with thedistribution function of injected carriers. The accumulation layer thickness isa few mono layers, and it does not depend on gate voltages, rather depends onthe chemical species.Comment: 4 figures, to be published in Phys. Rev.

Electric-field-induced charge injection or exhaustion in organic thin film transistor