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Using transmission electron microscopy (TEM) we studied CaCu3Ti4O12, anintriguing material that exhibits a huge dielectric response, up to kilohertzfrequencies, over a wide range of temperature. Neither in single crystals, norin polycrystalline samples, including sintered bulk- and thin-films, did weobserve the twin domains suggested in the literature. Nevertheless, in thesingle crystals, we saw a very high density of dislocations with a Burgervector of [110], as well as regions with cation disorder and planar defectswith a displacement vector 1/4[110]. In the polycrystalline samples, weobserved many grain boundaries with oxygen deficiency, in comparison with thegrain interior. The defect-related structural disorders and inhomogeneity,serving as an internal barrier layer capacitance (IBLC) in a semiconductingmatrix, might explain the very large dielectric response of the material. OurTEM study of the structure defects in CaCu3Ti4O12 supports a recently proposedmorphological model with percolating conducting regions and blocking regions.Comment: To be published in Physical Review B 21 pages, 8 figure

physical review. b, condensed matter and materials physics

Defect structure of the high-dielectric-constant perovskite<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Ca</mml:mi><mml:msub><mml:mi mathvariant="normal">Cu</mml:mi><mml:mn>3</mml:mn></mml:msub><mml:msub><mml:mi mathvariant="normal">Ti</mml:mi><mml:mn>4</mml:mn></mml:msub><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>12</mml:mn></mml:msub></mml:mrow></mml:math>

Defect structure of the high-dielectric-constant perovskiteCaCu3Ti4O12