English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We show how a new quantum property, a geometric phase, associated withscattering states can be exhibited in nanoscale electronic devices. We proposean experiment to use interference to directly measure the effect of the newgeometric phase. The setup involves a double path interferometer, adapted fromthat used to measure the phase evolution of electrons as they traverse aquantum dot (QD). Gate voltages on the QD could be varied cyclically andadiabatically, in a manner similar to that used to observe quantum adiabaticcharge pumping. The interference due to the geometric phase results inoscillations in the current collected in the drain when a small bias across thedevice is applied. We illustrate the effect with examples of geometric phasesresulting from both Abelian and non-Abelian gauge potentials.Comment: Six pages two figure

Measuring geometric phases of scattering states in nanoscale electronic devices