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We solve a longstanding problem--determining structural information fordisordered materials from their diffraction spectra--for the case of planardisorder in close-packed structures (CPSs). Our solution offers the mostcomplete possible statistical description of the disorder, and, from it, wefind the minimum effective memory length of disordered stacking sequences. Wealso compare our model of disorder with the so-called fault model (FM) anddemonstrate that in simple cases our approach reduces to the FM, but in casesthat are more complex it provides a general and more accurate structuraldescription than the FM. We demonstrate our technique on two previouslypublished zinc sulphide diffraction spectra.Comment: 4 pages, 4 figure

Discovering planar disorder in close-packed structures from x-ray diffraction: Beyond the fault model