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We use conducting-tip atomic force microscopy (AFM) to measure localelectronic properties of single wall carbon nanotube (SWNT) circuits oninsulating substrates. When a voltage is applied to the tip and AFM feedback isused to position the tip, images formed from the tip-sample tunnel current havesingle tube resolution (near 1 nm diameter), more than an order of magnitudebetter than simultaneously acquired topographic AFM images. By finding pointswhere the tip-sample current is zero, it is possible to measure theelectrochemical potential within the circuit, again with nanometer resolution.Such measurements provide compelling evidence that nanotubes within a bundlehave only weak electronic coupling. Finally the AFM tip is used as a localelectrostatic gate, and the gating action can be correlated with the structureof the SWNT bundle sample. This technique should be useful for a broad range ofcircuits containing SWNTs and other molecules.Comment: to appear in Physical Review B, Rapid Communication

Local electronic properties of single-wall nanotube circuits measured by conducting-tip AFM