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We investigate numerically the resistive transition in the two-dimensional XYgauge glass model. The resistively-shunted junction dynamics subject to thefluctuating twist boundary condition is used and the linear resistances in theabsence of an external current at various system sizes are computed. Throughthe use of the standard finite-size scaling method, the finite temperatureresistive transition is found at $k_BT_c = 0.22(2)$ (in units of the Josephsoncoupling strength) with dynamic critical exponent $z = 2.0(1)$ and the staticexponent $\nu = 1.2(2)$, in contrast to widely believed expectation of thezero-temperature transition. Comparisons with existing experiments andsimulations are also made.Comment: 5 pages in two columns, 4 eps figures included, to appear in PR

physical review. b, condensed matter

Finite-temperature resistive transition in the two-dimensional<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>XY</mml:mi></mml:math>gauge glass model

Finite-temperature resistive transition in the two-dimensionalXYgauge glass model