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We report x-ray reflectivity (XR) and small angle off-specular diffusescattering (DS) measurements from the surface of liquid Indium close to itsmelting point of $156^\circ$C. From the XR measurements we extract the surfacestructure factor convolved with fluctuations in the height of the liquidsurface. We present a model to describe DS that takes into account the surfacestructure factor, thermally excited capillary waves and the experimentalresolution. The experimentally determined DS follows this model with noadjustable parameters, allowing the surface structure factor to be deconvolvedfrom the thermally excited height fluctuations. The resulting local electrondensity profile displays exponentially decaying surface induced layeringsimilar to that previously reported for Ga and Hg. We compare the details ofthe local electron density profiles of liquid In, which is a nearly freeelectron metal, and liquid Ga, which is considerably more covalent and showsdirectional bonding in the melt. The oscillatory density profiles havecomparable amplitudes in both metals, but surface layering decays over a lengthscale of $3.5\pm 0.6$ \AA for In and $5.5\pm 0.4$ \AA for Ga. Upon controlledexposure to oxygen, no oxide monolayer is formed on the liquid In surface,unlike the passivating film formed on liquid Gallium.Comment: 9 pages, 5 figures; submitted to Phys. Rev.

Surface structure of liquid metals and the effect of capillary waves: X-ray studies on liquid indium