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The thermally stimulated currents (TSC) processes induced by ultraviolet light and x-ray irradiation at low temperature in oxidized magnesium-doped aluminum oxide single crystals has been studied between 80 and 300 K. It has been found that the main TSC process shows the same behavior as the main thermally stimulated polarization (TSP) process with respect to peak temperature, activation energy, and sample-thickness and thermal-treatment dependences. It is concluded that this TSC process, as it was also the case of the TSP one, arises from the thermally activated ionization of MgAl x centers and is due to the existence of blocking contacts at the sample-electrode interfaces. The observed irradiation-induced decrease in the thermally stimulated depolarization (TSD) currents can also be explained in the frame of the stimulated dielectric-relaxation-currents theory previously applied to the TSP and TSD phenomena in such metal-insulator-metal systems with blocking contacts. © 1999 The American Physical Society.Peer Reviewe

physical review. b, condensed matter

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