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Using the 'drift-diffusion-Langevin' equation, we have recently shown thatfinite-frequency shot noise in diffusive mesoscopic conductors is verysensitive to the ratio $\gamma \equiv L/\lee$ between the sample length $L$ andthe electron-electron mean free path $\lee$. In this work we present numericalcalculations of the noise at arbitrary value of $\gamma$. If coupled withaccurate noise measurements, the results presented here could serve as a newand independent way of determining $\lee$ in a given sample.Comment: 4 pages, published versio

Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise