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We present a Green's function approach based on a LCAO scheme to compute theelastic propagation of electrons injected from a STM tip into a metallic film.The obtained 2D current distribution in real and reciprocal space furnish agood representation of the elastic component of Ballistic Electron EmissionMicroscopy (BEEM) currents. Since this component accurately approximates thetotal current in the near threshold region, this procedure allows --in contrastto prior analyses-- to take into account effects of the metal band structure inthe modeling of these experiments. The Au band structure, and in particular itsgaps appearing in the [111] and [100] directions provides a good explanationfor the previously irreconcilable results of nanometric resolution andsimilarity of BEEM spectra on both Au/Si(111) and Au/Si(100).Comment: 12 pages, 9 postscript figures, revte

Quantum-mechanical analysis of the elastic propagation of electrons in the Au/Si system: Application to ballistic-electron-emission microscopy