English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

By virtue of the optical reciprocity theorem, Kossel diffraction in perfect crystals can be viewed as the reverse process of x-ray standing waves. An experimental method can then be devised to determine atomic positions in the bulk or at a surface of a crystal by analyzing the profile of angularly resolved Kossel lines. It is demonstrated that such a technique is sensitive enough to be applied to very dilute atomic concentrations of monolayer equivalency. Experimental results and a quantitative analysis for a buried, 7 Å thick layer of CoSi2 on a Si(111) substrate reveal the lattice position of Co atoms and confirm that Co-Si bonds form the interface between the CoSi2 layer and its Si substrate

Kossel diffraction in perfect crystals: X-ray standing waves in reverse